DocumentCode :
3704521
Title :
Electronic THz-spectrometer for plasmonic enhanced deep subwavelength layer detection
Author :
A. Berrier;M. C. Schaafsma;J. G?mez-Rivas;H. Sch?fer-Eberwein;P. Haring Bol?var;L. Tripodi;M. K. Matters-Kammerer
Author_Institution :
Center for Nanophotonics, FOM Institute AMOLF, COBRA Research Institute, Eindhoven University of Technology, The Netherlands
fYear :
2015
Firstpage :
925
Lastpage :
928
Abstract :
We demonstrate the operation of a miniaturized all-electronic CMOS based THz spectrometer with performances comparable to that of a THz-TDS spectrometer in the frequency range 20 to 220 GHz. The use of this all-electronic THz spectrometer for detection of a thin TiO2 layer and a B. subtilis bacteria film on top of a plasmonic surface is evaluated. The detection of deeply subwavelength layers with comparable performance as a femtosecond laser based THz-TDS spectrometer is demonstrated. The size of the all-electronic spectrometer is 5 cm by 1cm. The high degree of integration of this spectrometer in combination with plasmonics enhanced sensitivity opens the way to bring THz spectroscopy to consumer applications or to the practitioner´s office.
Keywords :
"Plasmons","Semiconductor device measurement","Antennas","Frequency measurement","CMOS integrated circuits","Sensitivity","Spectroscopy"
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2015 European
Type :
conf
DOI :
10.1109/EuMC.2015.7345915
Filename :
7345915
Link To Document :
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