DocumentCode :
3704586
Title :
A digital 70?140-GHz impedance tuner in 130-nm CMOS technology
Author :
Matthias Porranzl;Christoph Wagner;Herbert Jaeger;Andreas Stelzer
Author_Institution :
Institute for Communications Engineering and RF-Systems, Johannes Kepler University of Linz, A-4040, Austria
fYear :
2015
Firstpage :
1184
Lastpage :
1187
Abstract :
A novel structure of a digital controllable impedance tuner is proposed, operating from 70 to 140 GHz with special emphasis on easy control. 20 FETs are used for tuning the impedance. No parasitic compensation has to be applied on the FETs. Therefore the same impedance states can be generated in a wide frequency range and the area consumption of the tuner is small. A test chip of the tuner including an on-chip three wire interface is fabricated in a 130-nm CMOS technology. Based on deembedding structures, verification of the FET model is done in the W- and D-band. The tuners S-Parameters are measured on-wafer from 70 to 140 GHz. The tuner offers a quite constant maximum reflection coefficient over a full circle in the Smith chart.
Keywords :
"Tuners","Field effect transistors","Impedance","Resistors","Integrated circuit modeling","Logic gates","Capacitance"
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2015 European
Type :
conf
DOI :
10.1109/EuMC.2015.7345980
Filename :
7345980
Link To Document :
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