• DocumentCode
    3704586
  • Title

    A digital 70?140-GHz impedance tuner in 130-nm CMOS technology

  • Author

    Matthias Porranzl;Christoph Wagner;Herbert Jaeger;Andreas Stelzer

  • Author_Institution
    Institute for Communications Engineering and RF-Systems, Johannes Kepler University of Linz, A-4040, Austria
  • fYear
    2015
  • Firstpage
    1184
  • Lastpage
    1187
  • Abstract
    A novel structure of a digital controllable impedance tuner is proposed, operating from 70 to 140 GHz with special emphasis on easy control. 20 FETs are used for tuning the impedance. No parasitic compensation has to be applied on the FETs. Therefore the same impedance states can be generated in a wide frequency range and the area consumption of the tuner is small. A test chip of the tuner including an on-chip three wire interface is fabricated in a 130-nm CMOS technology. Based on deembedding structures, verification of the FET model is done in the W- and D-band. The tuners S-Parameters are measured on-wafer from 70 to 140 GHz. The tuner offers a quite constant maximum reflection coefficient over a full circle in the Smith chart.
  • Keywords
    "Tuners","Field effect transistors","Impedance","Resistors","Integrated circuit modeling","Logic gates","Capacitance"
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2015 European
  • Type

    conf

  • DOI
    10.1109/EuMC.2015.7345980
  • Filename
    7345980