Title :
Intelligent rapid investigation of S-parameters (IRIS)
Author :
Nikita Ambasana;Bhyrav Mutnury;Dipanjan Gope
Author_Institution :
Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore, India
Abstract :
IRIS is a consolidated platform to analyse bulk S-Parameter data, perform operations like termination/renormalization of port impedances, conversion from single-ended to mixed mode, evaluate complex equations in S-Parameters, plug-in, view and record violation of envelopes as defined by SATA, SAS, PCIe & USB spec sheets. It also implements a novel machine-learning based methodology [1] to efficiently bridge Frequency Domain (FD) and Time Domain (TD) by predicting Eye-Height (EH) and Eye-Widths (EW) from S-Parameters.
Keywords :
"Scattering parameters","Iris","Measurement","Mathematical model","Ports (Computers)","Artificial neural networks","Silicon"
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015 IEEE 24th
Print_ISBN :
978-1-5090-0038-8
DOI :
10.1109/EPEPS.2015.7347130
