• DocumentCode
    3705474
  • Title

    Voltage and time margin analysis for wireline links in high dimensional design spaces

  • Author

    Arash Zargaran-Yazd;John Yan

  • Author_Institution
    Rambus Inc., Sunnyvale, CA, USA
  • fYear
    2015
  • Firstpage
    195
  • Lastpage
    198
  • Abstract
    Evaluating the time and voltage margin (vtMargin) of a wireline link across all possible corner cases is deemed unfeasible using time-domain methods. Statistical methods provide estimates at a fraction of time, at the potential cost of accuracy and neglecting the nonlinear behaviors of various link elements. We present a methodology to calculate the vtMargin of memory and serial links in a time-efficient manner while considering nonlinear behaviors of active blocks. Using a small initial dataset, regression analysis is performed to find multi-variable multi-order equations, which are then exhaustively evaluated across all possible combinations of corner cases to find a more comprehensive histogram representing the margin spread in the link.
  • Keywords
    "Mathematical model","Histograms","Regression analysis","Semiconductor process modeling","Time-domain analysis","Analytical models","Robustness"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015 IEEE 24th
  • Print_ISBN
    978-1-5090-0038-8
  • Type

    conf

  • DOI
    10.1109/EPEPS.2015.7347160
  • Filename
    7347160