Title :
Voltage and time margin analysis for wireline links in high dimensional design spaces
Author :
Arash Zargaran-Yazd;John Yan
Author_Institution :
Rambus Inc., Sunnyvale, CA, USA
Abstract :
Evaluating the time and voltage margin (vtMargin) of a wireline link across all possible corner cases is deemed unfeasible using time-domain methods. Statistical methods provide estimates at a fraction of time, at the potential cost of accuracy and neglecting the nonlinear behaviors of various link elements. We present a methodology to calculate the vtMargin of memory and serial links in a time-efficient manner while considering nonlinear behaviors of active blocks. Using a small initial dataset, regression analysis is performed to find multi-variable multi-order equations, which are then exhaustively evaluated across all possible combinations of corner cases to find a more comprehensive histogram representing the margin spread in the link.
Keywords :
"Mathematical model","Histograms","Regression analysis","Semiconductor process modeling","Time-domain analysis","Analytical models","Robustness"
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2015 IEEE 24th
Print_ISBN :
978-1-5090-0038-8
DOI :
10.1109/EPEPS.2015.7347160