DocumentCode
3705545
Title
Exploration of technology parameter values of integrated circuit technologies
Author
Rodrigo Fonseca Rocha Soares;Frank Sill Torres;Dirk Timmermann
Author_Institution
Department of Electronic Engineering, Federal University of Minas Gerais, Belo Horizonte, Brazil
fYear
2015
Firstpage
118
Lastpage
125
Abstract
The definition of parameters of integrated circuit technologies is driven by technological constraints as well as by intended applications. In case of the latter, opposing criteria, like design delay, power consumptions and area, have to be considered. Common approaches focus usually on the analysis based on selected and isolated cells. However, this might not represent the exact impact of a technology parameter on actual designs. Hence, this work proposes a flow for the exploration of technology parameter values that considers the application in real designs. Additionally, the proposed approach allows the comparison of different technology generation with a reasonable effort. Results indicate an improvement of the predictions of up to 46 % in comparison to single cell analysis. Further, the applicability of the approach is successfully evaluated using a predictive technology based on Carbon nanotubes.
Keywords
"Logic gates","Delays","CNTFETs","Carbon nanotubes","FinFETs"
Publisher
ieee
Conference_Titel
Power and Timing Modeling, Optimization and Simulation (PATMOS), 2015 25th International Workshop on
Type
conf
DOI
10.1109/PATMOS.2015.7347596
Filename
7347596
Link To Document