DocumentCode :
3706336
Title :
Perpendicular magnetic field dependence of triangular triple silicon quantum dot system
Author :
R. Mizokuchi;T. Kodera;K. Horibe;S. Oda
Author_Institution :
Quantum Nanoelectronics Research Center, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo, Japan
fYear :
2014
fDate :
6/1/2014 12:00:00 AM
Firstpage :
1
Lastpage :
2
Abstract :
We have fabricated a triangular triple quantum dot system with 3 leads, which is made on a silicon-on-insulator wafer by dry etching and integrated with a single electron transistor as charge sensor. We have successfully monitored the charge transitions of each dot by charge sensor. We have observed charge degeneracy point and investigated a dependence of the point on perpendicular magnetic field.
Keywords :
"Voltage measurement","Quantum dots","Magnetic fields","Current measurement","Magnetic field measurement","Silicon","Temperature measurement"
Publisher :
ieee
Conference_Titel :
Silicon Nanoelectronics Workshop (SNW), 2014 IEEE
Print_ISBN :
978-1-4799-5676-0
Type :
conf
DOI :
10.1109/SNW.2014.7348573
Filename :
7348573
Link To Document :
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