• DocumentCode
    3706349
  • Title

    Edge-states at the onset of a silicon trigate nanowire FET

  • Author

    B. Voisin;V.-H. Nguyen;J. Renard;X. Jehl;S. Barraud;F. Triozon;M. Vinet;I. Duchemin;Y.-M. Niquet;S. de Franceschi;M. Sanquer

  • Author_Institution
    INAC-SPSMS, CEA &
  • fYear
    2014
  • fDate
    6/1/2014 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We investigate the onset of the few-electron regime through the undoped channel of a silicon “trigate” nanowire FET [1]. Low-temperature conductance measurements together with self-consistent calculations reveal the formation of one-dimensional conduction modes localized at the two upper edges of the channel. This localization occurs from charge traps located in the gate dielectric, resulting in about 10 nm-long quantum dots. We observe single-electron tunneling across two parallel dots one in each channel edge. We find addition energies of a few tens of meV and level spacings of the order of 1meV, which we ascribe to the valley orbit splitting. Lifting the valley degeneracy leaves only a two-fold spin degenerate level, making edge quantum dots potentially promising candidates for silicon spin qubits.
  • Keywords
    "Logic gates","Silicon","Quantum dots","Temperature measurement","Dielectrics","Field effect transistors","Energy measurement"
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop (SNW), 2014 IEEE
  • Print_ISBN
    978-1-4799-5676-0
  • Type

    conf

  • DOI
    10.1109/SNW.2014.7348586
  • Filename
    7348586