• DocumentCode
    3706350
  • Title

    Probing a single acceptor in a silicon nanotransistor

  • Author

    Joost van der Heijden;Joe Salfi;Jan A. Mol;Jan Verduijn;Giuseppe C. Tettamanzi;Alex R. Hamilton;Nadine Collaert;Sven Rogge

  • Author_Institution
    Centre for Quantum Comput. &
  • fYear
    2014
  • fDate
    6/1/2014 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We have demonstrated single hole transport through a silicon nano-transistor using an individual boron atom. Holes bound to acceptor atoms in silicon experience a much stronger spin-orbit interaction than electrons bound to donor atoms. This makes them interesting candidates for electric-field controllable qubits. The energy spectrum of the observed single boron atom in the transistor is 4-fold degenerate, which is expected for acceptor atoms in bulk silicon. This offers a unique two-level system of a heavy and light hole state in an already gated structure. The effect of the nanostructure is observed in a change of Landé g-factor compared to ensembles of boron atoms in bulk silicon.
  • Keywords
    "Silicon","Boron","Atomic measurements","Logic gates","Couplings","Temperature measurement","Stationary state"
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop (SNW), 2014 IEEE
  • Print_ISBN
    978-1-4799-5676-0
  • Type

    conf

  • DOI
    10.1109/SNW.2014.7348587
  • Filename
    7348587