Title :
Probing a single acceptor in a silicon nanotransistor
Author :
Joost van der Heijden;Joe Salfi;Jan A. Mol;Jan Verduijn;Giuseppe C. Tettamanzi;Alex R. Hamilton;Nadine Collaert;Sven Rogge
Author_Institution :
Centre for Quantum Comput. &
fDate :
6/1/2014 12:00:00 AM
Abstract :
We have demonstrated single hole transport through a silicon nano-transistor using an individual boron atom. Holes bound to acceptor atoms in silicon experience a much stronger spin-orbit interaction than electrons bound to donor atoms. This makes them interesting candidates for electric-field controllable qubits. The energy spectrum of the observed single boron atom in the transistor is 4-fold degenerate, which is expected for acceptor atoms in bulk silicon. This offers a unique two-level system of a heavy and light hole state in an already gated structure. The effect of the nanostructure is observed in a change of Landé g-factor compared to ensembles of boron atoms in bulk silicon.
Keywords :
"Silicon","Boron","Atomic measurements","Logic gates","Couplings","Temperature measurement","Stationary state"
Conference_Titel :
Silicon Nanoelectronics Workshop (SNW), 2014 IEEE
Print_ISBN :
978-1-4799-5676-0
DOI :
10.1109/SNW.2014.7348587