DocumentCode
3706350
Title
Probing a single acceptor in a silicon nanotransistor
Author
Joost van der Heijden;Joe Salfi;Jan A. Mol;Jan Verduijn;Giuseppe C. Tettamanzi;Alex R. Hamilton;Nadine Collaert;Sven Rogge
Author_Institution
Centre for Quantum Comput. &
fYear
2014
fDate
6/1/2014 12:00:00 AM
Firstpage
1
Lastpage
2
Abstract
We have demonstrated single hole transport through a silicon nano-transistor using an individual boron atom. Holes bound to acceptor atoms in silicon experience a much stronger spin-orbit interaction than electrons bound to donor atoms. This makes them interesting candidates for electric-field controllable qubits. The energy spectrum of the observed single boron atom in the transistor is 4-fold degenerate, which is expected for acceptor atoms in bulk silicon. This offers a unique two-level system of a heavy and light hole state in an already gated structure. The effect of the nanostructure is observed in a change of Landé g-factor compared to ensembles of boron atoms in bulk silicon.
Keywords
"Silicon","Boron","Atomic measurements","Logic gates","Couplings","Temperature measurement","Stationary state"
Publisher
ieee
Conference_Titel
Silicon Nanoelectronics Workshop (SNW), 2014 IEEE
Print_ISBN
978-1-4799-5676-0
Type
conf
DOI
10.1109/SNW.2014.7348587
Filename
7348587
Link To Document