DocumentCode :
3706356
Title :
Study of quantized-energy effects in Si nanoscale lateral pn junction diodes
Author :
S. Purwiyanti;H. N. Tan;D. Moraru;L. T. Anh;M. Manoharan;T. Mizuno;H. Mizuta;D. Hartanto;M. Tabe
Author_Institution :
Research Institute of Electronics, Shizuoka University, Japan
fYear :
2014
fDate :
6/1/2014 12:00:00 AM
Firstpage :
1
Lastpage :
2
Abstract :
In this work, we study SOI nanoscale pn junctions and find that transport characteristics are strongly affected by states of individual dopants and by quantized energy states. For pn diodes with lower doping concentration, we find that individual dopant atoms work as electron traps, inducing RTS in the diode current. On the other hand, for highly-doped pn diodes, quantization effects play critical roles in transport characteristics for both forward and reverse bias regimes.
Keywords :
"Junctions","Doping","Nanoscale devices","Silicon","Quantization (signal)","Tunneling","Energy states"
Publisher :
ieee
Conference_Titel :
Silicon Nanoelectronics Workshop (SNW), 2014 IEEE
Print_ISBN :
978-1-4799-5676-0
Type :
conf
DOI :
10.1109/SNW.2014.7348593
Filename :
7348593
Link To Document :
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