Title :
External forces for active contours using the undecimated wavelet transform
Author :
Ahmed Gawish;Paul Fieguth
Author_Institution :
Vision and Image Processing (VIP) Lab, Department of Systems Design Engineering, University of Waterloo, Waterloo, Canada
Abstract :
A limitation of active contours models (both parametric and geometric) is their sensitivity to noise. Many solutions to noise sensitivity have been proposed in the literature, with the current state-of-the-art based on image blurring and multiresolution processing. However a significant drawback of both approaches is the side effect of edge delocalization. In this paper, gradient information extracted from all resolutions of the undecimated wavelet transform is used to build the external force map for the active contour. The new map accurately drives the active contour and improves edge localization. The proposed method builds on both Gradient Vector Flow and Vector Field Convolution active contours. Comparisons to classical and state-of-the-art methods show a dramatic improvement in active contour convergence for all levels of noise.
Keywords :
"Active contours","Image resolution","Force","Image edge detection","Wavelet transforms","Sensitivity"
Conference_Titel :
Image Processing (ICIP), 2015 IEEE International Conference on
DOI :
10.1109/ICIP.2015.7351041