• DocumentCode
    3707466
  • Title

    Face sketch synthesis using non-local means and patch-based seaming

  • Author

    Liang Chang;Yves Rozenholc;Xiaoming Deng;Fuqing Duan;Mingquan Zhou

  • Author_Institution
    College of Information Science and Technology, Beijing Normal University, Beijing, China
  • fYear
    2015
  • Firstpage
    1508
  • Lastpage
    1512
  • Abstract
    This paper proposed a face sketch synthesis method by using non-local means (NL-Means), which takes the advantage of the non-local self-similarity of face photo and sketch patches. With a learning database of individuals described by one face photo and one face sketch, we assume that, for a given individual, the NL-Means coefficient of a given face photo patch is the same as its corresponding sketch patch. In order to handle the visible seam due to intensity difference of neighbor overlapping patches, we use patch based optimal seam to enforce the consistency of synthesized overlapping sketch patches. Experimental results on CUHK Face Sketch Database illustrate that our method has the advantage of easy implementation and much less required training samples, meanwhile our method can achieve fairly competitive synthesis results.
  • Keywords
    "Face","Training","Silicon","Databases","Feature extraction","Context","Markov processes"
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2015 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/ICIP.2015.7351052
  • Filename
    7351052