• DocumentCode
    3708365
  • Title

    Back diffusion of electrons in N2 subjected to crossed fields

  • Author

    M.S Dincer;H.R Hiziroglu

  • Author_Institution
    Department of Electrical & Electronics Engineering, Near East University, Nicosia, Cyprus
  • fYear
    2015
  • Firstpage
    559
  • Lastpage
    562
  • Abstract
    In the E/N range of 50 Td - 700 Td (1 Td = 10-21 Vm2), the back diffusion process for nitrogen subjected to crossed fields are investigated at B/N values ranging from 0 to 24.24 × 10-25 Tm3 by means of a Monte Carlo technique employing realistic collision cross sections. It is observed that at constant electron emission energy of 1.0 eV, for a given E/N the escape factor decreases as B/N increases. It is also observed that in the lower E/N range in crossed fields the escape factor is smaller than those of the higher E/N range. The escape factor on the magnetic deflection angle is evaluated and a dependence on the magnetic field is observed in crossed fields in the given ranges of E/N and B/N.
  • Keywords
    "Magnetic fields","Monte Carlo methods","Electric fields","Nitrogen","Argon","Sulfur hexafluoride","Cathodes"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2015 IEEE Conference on
  • Print_ISBN
    978-1-4673-7496-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2015.7351995
  • Filename
    7351995