DocumentCode :
3708365
Title :
Back diffusion of electrons in N2 subjected to crossed fields
Author :
M.S Dincer;H.R Hiziroglu
Author_Institution :
Department of Electrical & Electronics Engineering, Near East University, Nicosia, Cyprus
fYear :
2015
Firstpage :
559
Lastpage :
562
Abstract :
In the E/N range of 50 Td - 700 Td (1 Td = 10-21 Vm2), the back diffusion process for nitrogen subjected to crossed fields are investigated at B/N values ranging from 0 to 24.24 × 10-25 Tm3 by means of a Monte Carlo technique employing realistic collision cross sections. It is observed that at constant electron emission energy of 1.0 eV, for a given E/N the escape factor decreases as B/N increases. It is also observed that in the lower E/N range in crossed fields the escape factor is smaller than those of the higher E/N range. The escape factor on the magnetic deflection angle is evaluated and a dependence on the magnetic field is observed in crossed fields in the given ranges of E/N and B/N.
Keywords :
"Magnetic fields","Monte Carlo methods","Electric fields","Nitrogen","Argon","Sulfur hexafluoride","Cathodes"
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2015 IEEE Conference on
Print_ISBN :
978-1-4673-7496-5
Type :
conf
DOI :
10.1109/CEIDP.2015.7351995
Filename :
7351995
Link To Document :
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