DocumentCode :
3708449
Title :
Nonlinear relaxational polarization of Al2O3 and HfO2
Author :
Laxman Kankate;Herbert Kliem
Author_Institution :
Electrical Engineering Physics, Saarland University, Saarbr?cken, Germany
fYear :
2015
Firstpage :
640
Lastpage :
643
Abstract :
In order to increase the capacitance density and to minimize leakage currents, high permittivity metal oxides will probably replace silicon oxide in integrated circuits. But the capacitance-voltage curve of metal oxides turns out to be nonlinear and they display a dispersion of the capacitance-frequency behavior. By employing an asymmetric double well potential model with a distribution of distances between the wells resulting from the amorphous structure of the oxides both effects can be interpreted. Between the wells protons fluctuate by tunneling at low temperatures and by thermal activation at higher temperatures.
Keywords :
"Capacitance","Aluminum oxide","Protons","Tunneling","Hafnium oxide"
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2015 IEEE Conference on
Print_ISBN :
978-1-4673-7496-5
Type :
conf
DOI :
10.1109/CEIDP.2015.7352079
Filename :
7352079
Link To Document :
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