DocumentCode :
3708452
Title :
The impact of DC bias on electrical tree growth characteristics in epoxy resin samples
Author :
I. Iddrissu;S. M. Rowland
Author_Institution :
The University of Manchester, School of Electrical and Electronic Engineering, M13 9PL, United Kingdom
fYear :
2015
Firstpage :
876
Lastpage :
879
Abstract :
The effect of DC bias on electrical tree growth characteristics in epoxy resin samples is investigated, using three waveforms types: AC, AC with positive DC bias, and AC with negative DC bias. Point-to-plane samples were used. AC tests resulted in 62% and 48% longer average time to breakdown than positive and negative DC biased tests respectively. The negative DC bias test had 14% longer average time to breakdown than positive DC bias test. It is suggested that this is due to space charge injection modifying the field at the tree tip. 4 stages of distinct tree growth are identified in AC tests compared to 3 stages in DC bias tests. In particular, the phenomena of trees growing in the `reverse direction´ (from the planar to the point electrode) observed in the latter stages of AC tests, is not seen in the DC tests reported here. This is thought to be due to the peak field magnitudes involved in each case.
Keywords :
"Electric breakdown","Electrodes","Epoxy resins","Space charge","Insulation","HVDC transmission","Needles"
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2015 IEEE Conference on
Print_ISBN :
978-1-4673-7496-5
Type :
conf
DOI :
10.1109/CEIDP.2015.7352082
Filename :
7352082
Link To Document :
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