DocumentCode :
3710839
Title :
Revisiting delay variations statistically through an example
Author :
Valeriu Beiu;Mihai Tache
Author_Institution :
?Aurel Vlaicu? University of Arad, B-dul Revolu?iei nr. 77, 310130, Romania
fYear :
2015
Firstpage :
179
Lastpage :
182
Abstract :
This paper details preliminary results for a novel statistical analysis, using the delay of an inverter (the basic element of SRAM cells) as an example. The results obtained are statistically meaningful, and should allow for more accurate, faster, and better yield estimates.
Keywords :
"Delays","Transistors","Inverters","SRAM cells","Analytical models","Stability analysis"
Publisher :
ieee
Conference_Titel :
Semiconductor Conference (CAS), 2015 International
ISSN :
1545-827X
Print_ISBN :
978-1-4799-8862-4
Type :
conf
DOI :
10.1109/SMICND.2015.7355200
Filename :
7355200
Link To Document :
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