• DocumentCode
    3710891
  • Title

    Predicting service life of bypass diodes in photovoltaic modules

  • Author

    Narendra Shiradkar;Vivek Gade;Kalpathy Sundaram

  • Author_Institution
    Florida Solar Energy Center, University of Central Florida, 1679 Clearlake Road, Cocoa, 32922, USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Service life model for bypass diodes is a critical step towards developing service life models for PV modules. A review of failure mechanisms in bypass diodes along with the accelerated tests that could replicate them is presented. Susceptibility of commercially available bypass diodes for thermal runaway was studied. Accelerated tests were performed to study the diode wear out by High Temperature Forward Bias (HTFB) and Thermal Cycling (TC) mechanisms.
  • Keywords
    "Schottky diodes","Failure analysis","Temperature measurement","Silicon","Degradation","Acceleration"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7355606
  • Filename
    7355606
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3710891