• DocumentCode
    3710985
  • Title

    Application of flexible glass to prevent PID in PV modules

  • Author

    Jaewon Oh;GovindaSamy TamizhMani;Stuart Bowden;Sean Garner

  • Author_Institution
    Photovoltaic Reliability Laboratory, Arizona State University, Mesa, 85212, USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Potential induced degradation (PID) has recently been recognized by the industry as a critical PV module durability issue. Many methods to prevent PID have been developed at the cell and module levels in the factory and at the system level in the field. This paper presents a potential method for eliminating or minimizing the PID issue either in the factory during manufacturing or in the field after system installation. The method uses commercially available, thin and flexible Corning Willow™ glass sheets or strips on the glass superstrates of PV modules, disrupting the current leakage path from the cells to the grounded frame.
  • Keywords
    "Glass","Aluminum","Degradation","Stress","Photovoltaic systems","Strips"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7355701
  • Filename
    7355701