• DocumentCode
    3711065
  • Title

    Sub-100 nm resolution 3-D tomography of CZTSe using transmission X-ray Microscopy

  • Author

    D.S. Pruzan;A.E. Caruso;Y. Liu;Y. Lin;C. Beall;I. Repins;M.F. Toney;M.A. Scarpulla

  • Author_Institution
    Materials Science and Engineering Department, University of Utah, Salt Lake City, USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Transmission X-ray Microscopy (TXM) is a powerful technique with a theoretical resolution down to 30 nm that can be used to fill the mesoscale gap between the atomic scale resolution of atom probe tomography (APT) and macroscale resolution of energy dispersive spectroscopy (EDS). For this study, thin film solar cells based on Cu2ZnSnSe4 (CZTSe) absorber layers with Zn/Sn ratios of 1.0 and 1.4 were characterized using element-specific TXM and 3-D tomographic reconstruction. The resulting data are 3-D concentration fields for Cu, Zn, Sn, and Se. From these data we analyze compositional fluctuations at a previously inaccessible combination of sampling volume and resolution.
  • Keywords
    "Image reconstruction","Attenuation","Tomography","X-ray imaging","Photonics","Image edge detection","Absorption"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7355781
  • Filename
    7355781
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3711065