• DocumentCode
    3711126
  • Title

    On the reliability of photovoltaic short-circuit current temperature coefficient measurements

  • Author

    Carl R. Osterwald;Mark Campanelli;George J. Kelly;Rafell Williams

  • Author_Institution
    National Renewable Energy Laboratory, Golden, Colorado, 80401, USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The changes in short-circuit current of photovoltaic (PV) cells and modules with temperature are routinely modeled through a single parameter, the temperature coefficient (TC). This parameter is vital for the translation equations used in system sizing, yet in practice is very difficult to measure. In this paper, we discuss these inherent problems and demonstrate how they can introduce unacceptably large errors in PV ratings. A method for quantifying the spectral dependence of TCs is derived, and then used to demonstrate that databases of module parameters commonly contain values that are physically unreasonable. Possible ways to reduce measurement errors are also discussed.
  • Keywords
    "Temperature measurement","Silicon","Temperature sensors","Current measurement","Semiconductor device measurement","Databases","Temperature distribution"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7355842
  • Filename
    7355842