• DocumentCode
    3711127
  • Title

    Comparison of curve correction procedure of current and voltage as per IEC 60891 for thin film technology

  • Author

    Sarah Sowmya Priya;O.S. Sastry;Birinchi Bora;Avinash Kumar

  • Author_Institution
    Karunya University, India
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The performance of PV module is compared through measuring I-V characteristics at STC. But usually in the real outdoors the PV module behaves differently. To estimate the power and energy rating under different climatic conditions, I-V curves are extrapolated by applying corrections. In this paper we have examined I-V curve´s correction procedure as per IEC 60891 for different temperature and irradiance conditions of three thin film PV technologies viz. CIGS, CdTe, Micro-morph, and a comparison is made with measured data in real outdoor conditions. Deviations from estimated and measured output for three different correction procedures are compared. The correction procedure 3 gives the best results as compared to procedure 1 & procedure 2.
  • Keywords
    "Temperature measurement","Voltage measurement","Estimation","IEC Standards","Temperature","II-VI semiconductor materials","Cadmium compounds"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7355843
  • Filename
    7355843