DocumentCode
3711127
Title
Comparison of curve correction procedure of current and voltage as per IEC 60891 for thin film technology
Author
Sarah Sowmya Priya;O.S. Sastry;Birinchi Bora;Avinash Kumar
Author_Institution
Karunya University, India
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
1
Lastpage
4
Abstract
The performance of PV module is compared through measuring I-V characteristics at STC. But usually in the real outdoors the PV module behaves differently. To estimate the power and energy rating under different climatic conditions, I-V curves are extrapolated by applying corrections. In this paper we have examined I-V curve´s correction procedure as per IEC 60891 for different temperature and irradiance conditions of three thin film PV technologies viz. CIGS, CdTe, Micro-morph, and a comparison is made with measured data in real outdoor conditions. Deviations from estimated and measured output for three different correction procedures are compared. The correction procedure 3 gives the best results as compared to procedure 1 & procedure 2.
Keywords
"Temperature measurement","Voltage measurement","Estimation","IEC Standards","Temperature","II-VI semiconductor materials","Cadmium compounds"
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type
conf
DOI
10.1109/PVSC.2015.7355843
Filename
7355843
Link To Document