DocumentCode :
3711239
Title :
Analysis of gaas photovoltaic device losses at high MOCVD growth rates
Author :
Kenneth J. Schmieder;Matthew P. Lumb;Michael K. Yakes;Mar?a Gonz?lez;Paul D. Cunningham;Ani Khachatrian;Mitchell F. Bennett;Louise C. Hirst;Nicole A. Kotulak;Ziggy Pulwin;Christopher G. Bailey;Seth M. Hubbard;Joseph S. Melinger;Chris W. Ebert;Robert J. Wa
Author_Institution :
U.S. Naval Research Laboratory, Washington, DC 20375 USA
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
1
Lastpage :
3
Abstract :
Gallium arsenide material has been deposited via metal organic chemical vapor deposition (MOCVD) at growth rates varying between 14 μm/hr and 56 μm/hr. Photovoltaic device results indicate a 6-7% relative decrease in efficiency between 14 and 56 μm/hr GaAs solar cells, due to a reduction in short-circuit current and open-circuit voltage. By simulating the experimental characterization data, it is established that performance losses are associated with rear surface recombination velocity and Shockley-Read-Hall lifetime. The relative impact of these loss mechanisms will be quantified and conclude with discussions on their mitigation.
Keywords :
"Photovoltaic systems","Substrates"
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type :
conf
DOI :
10.1109/PVSC.2015.7355957
Filename :
7355957
Link To Document :
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