DocumentCode
3711272
Title
Failure modes and effect analysis of module level power electronics
Author
Arkanatha Sastry;Siddharth Kulasekaran;Jack Flicker;Raja Ayyanar;GovindSamy TamizhMani;Jinia Roy;Devarajan Srinivasan;Ian Tilford
Author_Institution
Arizona State University, Tempe, AZ, USA
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
1
Lastpage
3
Abstract
The scope for module level power electronics (MLPE) is immense in modern day PV industry but it lacks in assessing the reliability. This paper presents the work performed by PREDICTS (Physics of Reliability: Evaluating Design Insights for Component Technologies in Solar) team lead by Sandia National Laboratories to develop a standard reliability assessment protocol for MLPE including microinverters and microconverters. This paper discusses the ground work performed to develop the reliability assessment protocol by conducting FMEA (Failure Mode Effect & Analysis) and identify the top five failure modes that drive to the development of accelerated test similar to the existing PV module and power electronics industries.
Keywords
"Reliability","Capacitors","Power electronics","Industries","MOSFET","Standards","Life estimation"
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
Type
conf
DOI
10.1109/PVSC.2015.7355990
Filename
7355990
Link To Document