Accurate and rapid measurement of high-capacitance PV cells and modules using dark and light I-V characteristics with 10ms pulse-part 2

Some types of high-efficiency crystalline silicon PV technologies need longer time to accurately measure I-V due to the slow response caused by high-capacitance. We have already described in our previous paper ([2]) that we have developed a novel technology for I-V testers that can measure high-capacity solar cells and modules very accurate single short pulsed light. The pulsed light system has advantages over the continuous light system especially in module testing. Firstly, the system could be compact in size and far less expensive. Secondly, the maintenance is easy and its cost is far less. Thirdly, as it does not heat up the cell or the module, the temperature control is a lot easier. Our original technology (PDA: Photo and Dark Analysis technology, or KOPEL Method) needs a stable 20-50ms pulse, and makes two bidirectional sweeps while the light is on. We have already suggested a possibility in our previous paper ([6]) that we could use the method with a even high-capacitance solar cell measurement. In this paper, however, we focus on solar module measurement. If accurate measurement becomes possible for high-capacitance modules with 10ms pulse, it would be highly beneficial to the industry, for most of all the solar simulators installed in the laboratories and factories have capability to create a stable 10ms pulse, and can technology.