• DocumentCode
    3711313
  • Title

    Effect of series resistance on degradation of isc, power output and fill factor of HIT technology

  • Author

    Rashmi Singh;Birinchi Bora;Kamlesh Yadav;O. S. Sastry;Mithilesh Kumar;Avinash Kumar; Renu;Manander Bangar;Supriya Rai;Arun Kumar

  • Author_Institution
    Nat. Inst. of Solar Energy, Gurgaon, India
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents the Dependency of Series Resistance over a wide range of Irradiance And Temperature for HIT Technology As Per IEC 61853-1. A quantitative assessment of the effect of series resistance on electrical performance parameters of HIT technology has been studied from long term outdoor performance data. Degradation of the performance of HIT technology after one year of outdoor exposure has been studied and observed that with the increase of Series resistance outdoor exposure fill factor, power and Isc decreases.
  • Keywords
    "Reliability","Photovoltaic cells","Current measurement","Irrigation","Indium phosphide","III-V semiconductor materials"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7356032
  • Filename
    7356032
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3711313