Depth resolved preferential orientation of Cu(In,Ga)Se2 thin films based on the 112 peak model

X-ray diffraction is a commonly used technique to characterize the Cu(In,Ga)Se₂ thin films. It allows to derive information on the pureness of deposited layers, their preferential orientation and a degree of crystallization. In this work we present a detailed analysis of the shape of a very characteristic 112 peak and its dependence on the compositional profile of indium and gallium. Contrary to standard X-ray analysis we go one step further and from the comparison of calculated and measured 112 peaks we are able to determine the evolution of preferential orientation along the thickness of Cu(In,Ga)Se₂ thin film.