• DocumentCode
    3711426
  • Title

    Transparent electrodes in silicon heterojunction solar cells: Influence on carrier recombination

  • Author

    Andrea Tomasi;Florent Sahli;Lorenzo Fanni;Johannes P. Seif;Silvia Martin de Nicolas;Niels Holm;Jonas Geissb?hler;Bertrand Paviet-Salomon;Philipp L?per;Sylvain Nicolay;Stefaan De Wolf;Christophe Ballif

  • Author_Institution
    Photovoltaics and Thin-Film Electronics Laboratory, Institute of Microengineering (IMT), ?cole Polytechnique F?d?rale de Lausanne (EPFL), Neuch?tel, 2000, Switzerland
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Hole and electron collectors in silicon heterojunction solar cells consist of hydrogenated amorphous silicon layer stacks deposited on the crystalline silicon wafer surfaces. Charge carrier extraction from these layers is achieved by electrodes consisting of a transparent conductive oxide and a metal layer. Earlier, the mere presence of the transparent conductive oxide layer on top of the hole collecting stack was shown to alter minority carrier lifetimes, at low minority injection levels, of the crystalline silicon absorber. In this work, we present a detailed investigation of the magnitude and nature of these effects and discuss their impact on silicon heterojunction solar cell performance for the different device architectures.
  • Keywords
    "Thickness measurement","Energy measurement","Pressure measurement","Silicon","Indexes","Surface treatment"
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
  • Type

    conf

  • DOI
    10.1109/PVSC.2015.7356145
  • Filename
    7356145