Title :
Implementation of printed-AlOx PERC technology on multi-crystalline silicon solar cells: Impact of wafer quality
Author :
Tsung-Cheng Chen; Chen-Hao Ku; Yung-Sheng Lin; Cheng-Shun Hu; Ching-Chang Wen
Author_Institution :
E-ton Solar Tech Co., LTD., No.498, Sec. 2, Bentian Rd., Annan Dist., Tainan City 709, Taiwan, R.O.C.
fDate :
6/1/2015 12:00:00 AM
Abstract :
In this paper we implement our newly developed printed-AlOx PERC technology (ExcelTon™-III) on multi-crystalline silicon (mc-Si) solar cells. Using the ExcelTon™-III technology, efficiency gains of 0.7-0.9% compared to conventional single-crystalline silicon (c-Si) solar cells had been achieved. The current work is focus on studying what efficiency gains on mc-Si cells can be achieved as well as the impact of wafer quality on cell efficiency. The results indicate that the efficiency gains on mc-Si cells are significantly influenced by wafer quality. A larger variance of efficiency gains of 0.37-0.85% was observed even on the so-called high-performance mc-Si wafers. The best median efficiency of 18.77% with the champion efficiency of 18.83% was achieved in this preliminary study.
Keywords :
"Photovoltaic cells","Standards","Silicon","Production","Passivation","Statistical analysis","Market research"
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd
DOI :
10.1109/PVSC.2015.7356332
