DocumentCode
3711736
Title
Wrapper scan chains balance algorithm base on twice assigned by difference and mean value
Author
Deng Libao;Ning Fu;Qiao Liyan
Author_Institution
School of Information and Electrical Engineering, Harbin Institute of Technology at Weihai, China
fYear
2015
Firstpage
52
Lastpage
57
Abstract
The core test application time is based on the maximum scan-in/scan-out chains. To design a well balance wrapper scan chains is an important approach to reduce the test application time and test cost. We propose a wrapper scan chains balance algorithm base on twice-assigned algorithm by the chains difference and mean value. By selecting a standard chain with its length L, calculating the mean value V of all scan chains, then finding the chains which length longer than L from all internal scan chains of the IP core, computing the difference D with V of these chains, the first assignment is achieved by regarding these chains as V. By sorting the length shorter than L and D in descending order of length, the second assignment is achieved by assigning to the enable shortest or longest wrapper scan chain according whether D is positive or negative. The experimental results for the ITC´02 SOC Test Benchmark showed that the algorithm in this paper can get better balanced result when compared to the existing solutions.
Keywords
"Partitioning algorithms","Algorithm design and analysis","Silicon","Approximation algorithms","Electrical engineering","Very large scale integration","Complexity theory"
Publisher
ieee
Conference_Titel
IEEE AUTOTESTCON, 2015
Type
conf
DOI
10.1109/AUTEST.2015.7356466
Filename
7356466
Link To Document