• DocumentCode
    3712575
  • Title

    Development of Bump Support Film (BSF) for expanding the size of WLCSP

  • Author

    Masanori Yamagishi;Shinya Takyu;Naoya Saiki;Akinori Sato;Rey Alvarado

  • Author_Institution
    Lintec Corporation, 5-14-42 Nishiki-cho, Warabi-shi, Saitama 335-0005, Japan
  • fYear
    2015
  • Firstpage
    29
  • Lastpage
    32
  • Abstract
    Solder joint crack is increasing with increasing of warpage caused by larger Wafer Level Chip Size Package (WLCSP). In this study, we studied new Bump Support Film (BSF) made of back grind tape and thermosetting epoxy resin, which covers the bottom of bumps by heat lamination. We succeeded to form the BSF without voids at the bottom of the bumps by optimizing the thickness of thermosetting epoxy resin layer. We also succeeded to remove residues of BSF at top of the bumps by dicing process. In addition, the board level test of IC chip with BSF shows no electrical defect after reflow process.
  • Keywords
    "Epoxy resins","Lamination","Curing","Semiconductor device reliability","Surface treatment","Films"
  • Publisher
    ieee
  • Conference_Titel
    CPMT Symposium Japan (ICSJ), 2015 IEEE
  • Print_ISBN
    978-1-4799-8814-3
  • Type

    conf

  • DOI
    10.1109/ICSJ.2015.7357352
  • Filename
    7357352