Title :
Thermal-electromagnetic susceptibility behaviors of PWM patterns used in control electronic circuit
Author :
Jean-marc Dienot;Emmanuel Batista;Ioav Ramos
Author_Institution :
LGP - Labceem University of Toulouse, Tarbes, France
Abstract :
With constraints for high-level integration of electronics, new EMC behaviors have to be considered to prevent real electromagnetic compliance. Especially, in embedded and on-board device´s context, environmental temperature has an influence on the circuit behavior and EMC figures. This paper deals with susceptibility studies combined with temperature effects on electronic devices used to control power and transmissions. Specific dual thermal-electromagnetic test set-up developed for this are presented. Main results of an experimental campaign on digital PCB dedicated for generation of Pulse Width Modulation (PWM) patterns are presented. Temperature dependant susceptibility and sensitivity of the PWM parameters are compared and analyzed.
Keywords :
"Pulse width modulation","Probes","Immunity testing","TEM cells","Temperature measurement","Electromagnetics"
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2015 10th International Workshop on the
DOI :
10.1109/EMCCompo.2015.7358355