• DocumentCode
    3713286
  • Title

    Characterization of the immunity of integrated circuits (ICs) at wafer level

  • Author

    Andrea Lavarda;Dominik Amschl;Susanne Bauer;Bernd Deutschmann

  • Author_Institution
    Graz University of Technology, Institute of Electronics, Austria
  • fYear
    2015
  • Firstpage
    196
  • Lastpage
    201
  • Abstract
    This paper deals with the characterization of the immunity of integrated circuits (ICs) by means of their susceptibility to conducted radio frequency (RF) electromagnetic interferences (EMI). It describes and analyses a framework to perform such characterization at wafer level, highlighting the benefits that are reaped from it and the problems that can be faced during the test bench setup and the measurement procedure, providing some possible solutions.
  • Keywords
    "Radio frequency","Integrated circuits","Probes","Immunity testing","Ports (Computers)"
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2015 10th International Workshop on the
  • Type

    conf

  • DOI
    10.1109/EMCCompo.2015.7358356
  • Filename
    7358356
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3713286