• DocumentCode
    3713295
  • Title

    Smart power IC macromodeling for DPI analysis

  • Author

    H. Herrmann;W. Horchler;S. Schwarz;P. Schr?ter;F. Klotz;M. Brignone;F. Fiori

  • Author_Institution
    Infineon Technologies AG, Munich, Germany
  • fYear
    2015
  • Firstpage
    244
  • Lastpage
    247
  • Abstract
    This paper deals with the susceptibility to radio frequency interference of smart power integrated circuits. A method to perform simulations aimed at evaluating the performance of subcircuits included in a more complex IC in the presence of EMI is presented. Referring to this, the behaviour of a current sensor included into a high-side power switch during DPI test is investigated. The results of simulation analyses and DPI tests are presented.
  • Keywords
    "Integrated circuit modeling","Equivalent circuits","Electromagnetic compatibility","Radio frequency","Analytical models","Switching circuits"
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2015 10th International Workshop on the
  • Type

    conf

  • DOI
    10.1109/EMCCompo.2015.7358365
  • Filename
    7358365
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3713295