Title :
Smart power IC macromodeling for DPI analysis
Author :
H. Herrmann;W. Horchler;S. Schwarz;P. Schr?ter;F. Klotz;M. Brignone;F. Fiori
Author_Institution :
Infineon Technologies AG, Munich, Germany
Abstract :
This paper deals with the susceptibility to radio frequency interference of smart power integrated circuits. A method to perform simulations aimed at evaluating the performance of subcircuits included in a more complex IC in the presence of EMI is presented. Referring to this, the behaviour of a current sensor included into a high-side power switch during DPI test is investigated. The results of simulation analyses and DPI tests are presented.
Keywords :
"Integrated circuit modeling","Equivalent circuits","Electromagnetic compatibility","Radio frequency","Analytical models","Switching circuits"
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2015 10th International Workshop on the
DOI :
10.1109/EMCCompo.2015.7358365
