• DocumentCode
    3714393
  • Title

    Hausdorff distance and global silhouette index as novel measures for estimating quality of biclusters

  • Author

    Nishchal K. Verma;Esha Dutta; Yan Cui

  • Author_Institution
    Dept. of Electrical Engineering, IIT Kanpur, India
  • fYear
    2015
  • Firstpage
    267
  • Lastpage
    272
  • Abstract
    Biclustering is a commonly used technique for extracting local patterns from microarray data, for which several algorithms have been proposed. Hence it is important to define metrics that compare the various algorithms. In this paper, we have defined novel measures of hausdorff distance between biclusters and global silhouette index for estimating the quality of biclusters extracted by the existing algorithms. We have also compared these measures with the standard measures such as the proportion of enriched biclusters for benchmark biological datasets. Our experimental results show almost similar variation of all these metrics for most of the datasets. The computation of these metrics for a given dataset for all the existing algorithms gives the most suited algorithm for the considered dataset.
  • Keywords
    "Indexes","High definition video","Silicon","Cognition"
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and Biomedicine (BIBM), 2015 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/BIBM.2015.7359691
  • Filename
    7359691