Title :
A proposal for updating the standard IEC-61123 - compliance test plans for success ratio
Author :
Ofer Shaham;Yefim Haim Michlin
Author_Institution :
RAFAEL - Advanced Defense Systems Ltd, Microelectronics Directorate, P.O.Box 2250, Haifa 31021, Israel
Abstract :
An improvement of IEC-61123 in the field of sequential probability ratio test (SPRT) is proposed. The current standard does not provide a proper solution for modern industry´s needs, and the test plans are not up-to-date with the knowledge in the area of sequential tests. The advantages of the proposed version are reflected by the efficacy and accuracy of the tests, the wider range of the ready to use test´s parameters, and available data regarding the test´s characteristics. The proposed version is a significant improvement over the existing one. The changes will extend the use of SPRT and this standard.
Keywords :
"Yttrium","Standards","Production","Computers","Indexes","Reliability","Market research"
Conference_Titel :
Microwaves, Communications, Antennas and Electronic Systems (COMCAS), 2015 IEEE International Conference on
DOI :
10.1109/COMCAS.2015.7360420