Numerical analysis of the unwanted influence of a probe fixture in transient electromagnetic field

Probe fixtures are often utilized in electromagnetic compatibility measurements to position field probes, especially in field uniformity calibration. The unwanted influence of a probe fixture in the transient electromagnetic field is calculated by finite integration technique in this paper. The numerical results show that the introduction of a probe fixture does bring some influence on the field measurement. The electromagnetic field is perturbed not only because of the high permittivity materials, but also due to the height of the probe fixture. This will do good to design a suitable probe fixture for field measurement, as well as to properly evaluate the measurement uncertainty of the field calibration results.