• DocumentCode
    3715009
  • Title

    A study on system-level ESD stress simulation using circuit simulator

  • Author

    Takahiro Yoshida;Noriaki Masui

  • Author_Institution
    Department of Electrical Engineering, Tokyo University of Science, 1-3 Kagurazaka, Shinjuku-ku, 162-8601, JAPAN
  • fYear
    2013
  • fDate
    5/1/2013 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we proposed and examined the simulation method for system-level ESD using ESD source model, transmission line model, and ESD protection circuit model on the existent circuit simulator. We also evaluated the simulation method by comparison of the simulated and measured results using test PCB and ESD-gun. In this experiment, we targeted the voltage waveforms at input signal pin of the D-F/F IC on the test PCB when the ESD stress is injected to the signal line on the PCB. From experimental results, it is found that the proposed simulation method can simulate system-level ESD stress if the characteristics of the ESD protection circuit can measure.
  • Keywords
    "Electrostatic discharges","Integrated circuit modeling","Transmission line measurements","Solid modeling","Stress","Current measurement","RLC circuits"
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2013 Asia-Pacific Symposium on
  • Type

    conf

  • DOI
    10.1109/APEMC.2013.7360625
  • Filename
    7360625