DocumentCode :
3717455
Title :
Fast detection of material deformation through structural dissimilarity
Author :
Daniela Ushizima;Talita Perciano;Dilworth Parkinson
Author_Institution :
CRD, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
fYear :
2015
Firstpage :
2775
Lastpage :
2781
Abstract :
Designing materials that are resistant to extreme temperatures and brittleness relies on assessing structural dynamics of samples. Algorithms are critically important to characterize material deformation under stress conditions. Here, we report on our design of coarse-grain parallel algorithms for image quality assessment based on structural information and on crack detection of gigabyte-scale experimental datasets. We show how key steps can be decomposed into distinct processing flows, one based on structural similarity (SSIM) quality measure, and another on spectral content. These algorithms act upon image blocks that fit into memory, and can execute independently. We discuss the scientific relevance of the problem, key developments, and decomposition of complementary tasks into separate executions. We show how to apply SSIM to detect material degradation, and illustrate how this metric can be allied to spectral analysis for structure probing, while using tiled multi-resolution pyramids stored in HDF5 chunked multi-dimensional arrays. Results show that the proposed experimental data representation supports an average compression rate of 10X, and data compression scales linearly with the data size. We also illustrate how to correlate SSIM to crack formation, and how to use our numerical schemes to enable fast detection of deformation from 3D datasets evolving in time.
Keywords :
"Algorithm design and analysis","Three-dimensional displays","Image analysis","X-ray imaging","TV","Spectral analysis","Distortion"
Publisher :
ieee
Conference_Titel :
Big Data (Big Data), 2015 IEEE International Conference on
Type :
conf
DOI :
10.1109/BigData.2015.7364080
Filename :
7364080
Link To Document :
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