Title :
Test-driven modeling of embedded systems
Author :
Allan Munck;Jan Madsen
Author_Institution :
Department of Systems Engineering at GN Resound & Section of Embedded Systems Engineering at Department of Applied Mathematics and Computer Science, Technical University of Denmark, Denmark
Abstract :
To benefit maximally from model-based systems engineering (MBSE) trustworthy high quality models are required. From the software disciplines it is known that test-driven development (TDD) can significantly increase the quality of the products. Using a test-driven approach with MBSE may have a similar positive effect on the quality of the system models and the resulting products and may therefore be desirable. To define a test-driven model-based systems engineering (TD-MBSE) approach, we must define this approach for numerous sub disciplines such as modeling of requirements, use cases, scenarios, behavior, architecture, etc. In this paper we present a method that utilizes the formalism of timed automatons with formal and statistical model checking techniques to apply TD-MBSE to the modeling of system architecture and behavior. The results obtained from applying it to an industrial case suggest that our method provides a sound foundation for rapid development of high quality system models.
Keywords :
"Unified modeling language","Model checking","Automata","Analytical models","Software"
Conference_Titel :
Nordic Circuits and Systems Conference (NORCAS): NORCHIP & International Symposium on System-on-Chip (SoC), 2015
DOI :
10.1109/NORCHIP.2015.7364410