DocumentCode
3717568
Title
Tracking PVT variations of Pulse Width Controlled PLL using variable-length ring oscillator
Author
Takashi Toi;Toru Nakura;Tetsuya Iizuka;Kunihiro Asada
Author_Institution
Dept. of Electronic Engineering, The University of Tokyo, Japan
fYear
2015
Firstpage
1
Lastpage
4
Abstract
This paper presents a PWPLL (Pulse-Width Controlled PLL) using a variable-length ring oscillator for autonomously tracking PVT (Process, Voltage and Temperature) variations. We fix the ring oscillator control code and the numbers of the reference CLKs and the feedback CLKs are compared, and then the additional Tracking Circuits switch the number of stages for a PWPLL to be locked. The PWPLL using a variable-length ring oscillator is implemented in a 180nm CMOS process. The measurement results of the prototype chip show it achieves 25% increase of the lock range from a conventional PWPLL, and 0.0265mm2 layout area along with 2.99ps rms jitter while consuming 4.79mW under a 1.8V supply with 600MHz output frequency.
Keywords
"Ring oscillators","Phase locked loops","Switching circuits","Jitter","Frequency measurement","Semiconductor device measurement"
Publisher
ieee
Conference_Titel
Nordic Circuits and Systems Conference (NORCAS): NORCHIP & International Symposium on System-on-Chip (SoC), 2015
Type
conf
DOI
10.1109/NORCHIP.2015.7364412
Filename
7364412
Link To Document