• DocumentCode
    3718308
  • Title

    Challenge of 12? CIS CSP development, explore via finite element method

  • Author

    Tom Ni;Scott Su;Anna Cheng;Shirley Lu;Teddy Su;CC Chang;David Fang;Johnson Tai

  • Author_Institution
    Powertech Technology Inc., No. 15, Li-Hsin Rd. III, Science Based Industrial Park, Hsinchu, Taiwan
  • fYear
    2015
  • Firstpage
    281
  • Lastpage
    284
  • Abstract
    Sensor is expected being an important component in coming IoT era. CIS CSP solution has been wildly adopted for the secondary camera in a smart phone but majority stayed in 8" T-contact CSP in the past years. The 12" solution is more attractive due to its low cost to drive the supply chain moving forward. The major contribution came from the gross die gain based on the analysis result. 12" CIS CSP is the critical path at this moment. In order to shorten development cycle time, finite element method is used to address the structure integrity from reliability point of view. The commercial software, ANSYS, is used to create the FEM model and conduct the parametric study.
  • Keywords
    "Stress","Finite element analysis","Cameras","Glass","Metals","Chip scale packaging","Reliability"
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2015 10th International
  • Print_ISBN
    978-1-4673-9690-5
  • Type

    conf

  • DOI
    10.1109/IMPACT.2015.7365196
  • Filename
    7365196