• DocumentCode
    3718349
  • Title

    Test wrapper bandwidth assignment for minimizing the SoC test application time

  • Author

    Cheng-Hsun Nien; Chun-Hua Cheng; Shih-Hsu Huang

  • Author_Institution
    Department of Electronic Engineering, Chung Yuan Christian University, Taoyuan City, Taiwan, R.O.C.
  • fYear
    2015
  • Firstpage
    394
  • Lastpage
    397
  • Abstract
    The test application time of a core may decrease as the bandwidth of its test wrapper increases. Since the total bandwidth of a TAM is fixed, there is a need to properly determine the bandwidth of each test wrapper for minimizing the total test application time. Based on this observation, in this paper, we propose an integer linear programming (ILP) approach to perform the simultaneous application of test wrapper bandwidth assignment and test scheduling for minimizing the total test application time. The main contributions of our work are elaborated below. First, Our approach is the first work that performs the simultaneous application of test wrapper bandwidth assignment and test scheduling for minimizing the total test application time. Secondly, the proposed ILP approach guarantees solving this problem optimally. Compared with the previous work, in which the bandwidth of each test wrapper is fixed, experimental results show that our approach can reduce 21% total test application time.
  • Keywords
    "Bandwidth","Upper bound","Integer linear programming","Testing","Algorithm design and analysis","Scheduling","Wires"
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2015 10th International
  • Print_ISBN
    978-1-4673-9690-5
  • Type

    conf

  • DOI
    10.1109/IMPACT.2015.7365237
  • Filename
    7365237