• DocumentCode
    3718498
  • Title

    Table of contents

  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The following topics are dealt with: dose effects in devices and integrated circuits; radiation effect mechanisms; hardness assurance; single event effects in devices and integrated circuits; radiation environments; single event transients; photonics and optoelectronics devices; dosimetry; radiation effects data workshop; hardening by technology, design and system; single event effects mechanisms and modeling.
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365573
  • Filename
    7365573
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718498