• DocumentCode
    3718503
  • Title

    A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

  • Author

    A. Bosser;V. Gupta;G. Tsiligiannis;R. Ferraro;C. Frost;A. Javanainen;H. Puchner;M. Rossi;F. Saigne;A. Virtanen;F. Wrobel;A. Zadeh;L. Dilillo

  • Author_Institution
    Dept. of Phys., Univ. of Jyvaskyla, Jyvaskyla, Finland
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions.
  • Keywords
    "Random access memory","Sensitivity","Market research","Arrays","Electronic mail","Protons","Radiation effects"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365578
  • Filename
    7365578
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718503