• DocumentCode
    3718520
  • Title

    Connection of the Parametric and Functional Control for TID Testing of Complex VLSI Circuits

  • Author

    Vladimir A. Marfin;Pavel V. Nekrasov;Ilya O. Loskutov

  • Author_Institution
    Inst. of Extreme Appl. Electron., Nat. Res. Nucl. Univ. MEPHI, Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The article describes an original technique for TID testing of complex VLSI circuits (microprocessors) based on combined use of parametric and functional control. The resulting dependences obtained in radiation experiment are qualitatively confirmed by circuit simulation.
  • Keywords
    "Semiconductor device modeling","Integrated circuit modeling","CMOS integrated circuits","Inverters","Very large scale integration","Microprocessors","Degradation"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365595
  • Filename
    7365595
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718520