• DocumentCode
    3718522
  • Title

    Dark Current Spectroscopy on Alpha Irradiated CMOS Image Sensors

  • Author

    Jean-Marc Belloir;Vincent Goiffon;Cedric Virmontois;Melanie Raine;Philippe Paillet;Pierre Magnan;Olivier Gilard

  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Dark Current Spectroscopy of radiation-induced defects is tested for the first time in CMOS Image Sensors. Several dark current peaks are observed and their evolution with fluence, particle energy and temperature is studied.
  • Keywords
    "Dark current","Alpha particles","Current measurement","Radiation effects","Photodiodes","Ionization","Spectroscopy"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365597
  • Filename
    7365597
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718522