• DocumentCode
    3718537
  • Title

    Experimental Study of 0.18µm and 65nm SRAM SEUs Induced by Heavy Ions, High Energy Protons and Low Energy Protons on Orbits

  • Author

    Qingkui Yu;Lei Luo;Min Tang;Yi Sun;Zhichao Wei;Zheng Li;Ming Zhu

  • Author_Institution
    China Acad. of Space Technol., Beijing, China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The SEU rates of 65nm SRAM and 0.18μm SRAM on orbits are experimentally studied. SEUs are tested with heavy ions, high energy protons and low energy protons by accelerator. The SEU rates induced by heavy ion direct ionizing, proton nuclear reaction and proton direct ionizing on LEO and GEO are calculated respectively based on the experiment data. The results that which factor contributes more to the total SEU rates are given.
  • Keywords
    "Protons","Random access memory","Single event upsets","Low earth orbit satellites","Orbits","Space vehicles"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365612
  • Filename
    7365612
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718537