Title :
Experimental Study of 0.18µm and 65nm SRAM SEUs Induced by Heavy Ions, High Energy Protons and Low Energy Protons on Orbits
Author :
Qingkui Yu;Lei Luo;Min Tang;Yi Sun;Zhichao Wei;Zheng Li;Ming Zhu
Author_Institution :
China Acad. of Space Technol., Beijing, China
Abstract :
The SEU rates of 65nm SRAM and 0.18μm SRAM on orbits are experimentally studied. SEUs are tested with heavy ions, high energy protons and low energy protons by accelerator. The SEU rates induced by heavy ion direct ionizing, proton nuclear reaction and proton direct ionizing on LEO and GEO are calculated respectively based on the experiment data. The results that which factor contributes more to the total SEU rates are given.
Keywords :
"Protons","Random access memory","Single event upsets","Low earth orbit satellites","Orbits","Space vehicles"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365612
