• DocumentCode
    3718540
  • Title

    Flash-Based FPGA TID and Long-Term Retention Reliability through VT Shift Investigation

  • Author

    Jih-Jong Wang;Nadia Rezzak;Durwyn Dsilva;Fengliang Xue;Salim Samiee;Pavan Singaraju;James Jia;Frank Hawley;Esmat Hamdy

  • Author_Institution
    Microsemi-SOC, San Jose, CA, USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Reliability test results of data retention and total ionizing dose (TID) in 65 nm Flash-based field programmable gate array (FPGA) are reviewed. Long-chain inverter design is recommended for reliability evaluation because it can detect degradations of both programmable and erased Flash cells. All the reliability issues are unified and modeled by one natural decay equation.
  • Keywords
    "Field programmable gate arrays","Reliability","Mathematical model","Nonvolatile memory","Logic gates","Switches","Threshold voltage"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365615
  • Filename
    7365615
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718540