• DocumentCode
    3718544
  • Title

    Identification of Authenticity of Microelectronic Devices Using Radiation Simulation Modeling

  • Author

    D. V. Boychenko;T. A. Kondratyeva;A. Yu. Nikiforov;Yu. A. Ozhegin;V. A. Telets

  • Author_Institution
    Nat. Res. Nucl. Univ. MEPhI (Moscow Eng. Phys. Inst.), Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The article outlines a methodological approach, core specifics and capabilities of radiation identification of microelectronic devices at a specified exposure to ionizing radiation.
  • Keywords
    "Microelectronics","Radiation effects","Integrated circuit modeling","Production","Object recognition","Physics","Consumer electronics"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365619
  • Filename
    7365619
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718544