• DocumentCode
    3718548
  • Title

    Investigation of Nonuniform Degradation of CMOS-Sensor Light-Sensitive Surface under Gamma-Irradiation

  • Author

    Maksim E. Cherniak;Anatoly A. Smolin;Anastasiya V. Ulanova;Alexander Y. Nikiforov

  • Author_Institution
    Specialized Electron. Syst., Moscow, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The paper discusses nonuniform degradation effect for peripheral and central elements of CMOS-sensor light-sensitive surface under γ-irradiation. Spatial dependence of individual pixels´ radiation hardness was investigated. The paper also assesses the possible causes of this phenomenon.
  • Keywords
    "Degradation","Radiation effects","Microelectronics","Lenses","Histograms","Yttrium","Sensitivity"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
  • Print_ISBN
    978-1-5090-0232-0
  • Type

    conf

  • DOI
    10.1109/RADECS.2015.7365623
  • Filename
    7365623
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3718548