Title :
Investigation of Nonuniform Degradation of CMOS-Sensor Light-Sensitive Surface under Gamma-Irradiation
Author :
Maksim E. Cherniak;Anatoly A. Smolin;Anastasiya V. Ulanova;Alexander Y. Nikiforov
Author_Institution :
Specialized Electron. Syst., Moscow, Russia
Abstract :
The paper discusses nonuniform degradation effect for peripheral and central elements of CMOS-sensor light-sensitive surface under γ-irradiation. Spatial dependence of individual pixels´ radiation hardness was investigated. The paper also assesses the possible causes of this phenomenon.
Keywords :
"Degradation","Radiation effects","Microelectronics","Lenses","Histograms","Yttrium","Sensitivity"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365623
