Title :
Investigation of Single Event Functional Interrupts in Microcontoller with PIC17 Architecture
Author :
Pavel V. Nekrasov;Andrey B. Karakozov;Dmitry V. Bobrovskyi;Vladimir A. Marfin
Author_Institution :
Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
the article is devoted to the study of single event functional interrupts in microprocessors and microcontrollers. SEFI detection method is discussed. The influence of supply voltage, operating frequency and program code on SEFI cross section is examined. In addition the new simplified method of SEFI cross-section calculation based on critical memory space estimation is presented.
Keywords :
"Random access memory","Hardware","Registers","Ground penetrating radar","Single event upsets","Microcontrollers"
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2015 15th European Conference on
Print_ISBN :
978-1-5090-0232-0
DOI :
10.1109/RADECS.2015.7365625
